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On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits

 

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Opened Access On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits
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Author: Vázquez García de la Vega, Diego
Huertas Sánchez, Gloria
Léger, Gildas
Peralías Macías, Eduardo
Rueda Rueda, Adoración
Huertas Díaz, José Luis
Department: Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo
Date: 2002
Published in: Analog Integrated Circuits and Signal Processing, 33 (2), 201-211.
Document type: Article
Abstract: This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, frequency and DC level) in the digital domain requiring just a very simple and robust circuitry. Experimental results obtained from an integrated chip demonstrate the feasibility of the approach
Cite: Vázquez García de la Vega, D., Huertas Sánchez, G., Leger Leger, G., Peralías Macías, E., Rueda Rueda, A. y Huertas Díaz, J.L. (2002). On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits. Analog Integrated Circuits and Signal Processing, 33 (2), 201-211.
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URI: https://hdl.handle.net/11441/77101

DOI: 10.1023/A:1021276218012

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