Repositorio de producción científica de la Universidad de Sevilla

A CMOS Digital SiPM With Focal-Plane Light-Spot Statistics for DOI Computation

 

Advanced Search
 
Opened Access A CMOS Digital SiPM With Focal-Plane Light-Spot Statistics for DOI Computation
Cites

Show item statistics
Icon
Export to
Author: Vornicu, I.
Bandi, Franco
Carmona Galán, Ricardo
Rodríguez Vázquez, Ángel Benito
Department: Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo
Date: 2017
Published in: IEEE Sensors Journal, 17 (3), 632-643.
Document type: Article
Abstract: Silicon photomultipliers can be used to infer the depth-of-interaction (DOI) in scintillator crystals. DOI can help to improve the quality of the positron emission tomography images affected by the parallax error. This paper contemplates the computa...
[See more]
Cite: Vornicu, I., Bandi, F., Carmona Galán, R. y Rodríguez Vázquez, Á.B. (2017). A CMOS Digital SiPM With Focal-Plane Light-Spot Statistics for DOI Computation. IEEE Sensors Journal, 17 (3), 632-643.
Size: 1.874Mb
Format: PDF

URI: https://hdl.handle.net/11441/73486

DOI: 10.1109/JSEN.2016.2632200

See editor´s version

This work is under a Creative Commons License: 
Attribution-NonCommercial-NoDerivatives 4.0 Internacional

This item appears in the following Collection(s)