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On-chip characterization of RF systems based on envelope response analysis

Opened Access On-chip characterization of RF systems based on envelope response analysis

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Autor: Barragán Asián, Manuel José
Fiorelli, Rafaella
Vázquez García de la Vega, Diego
Rueda Rueda, Adoración
Huertas Díaz, José Luis
Departamento: Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo
Fecha: 2010
Publicado en: Electronics Letters, 46 (1), 36-38.
Tipo de documento: Artículo
Resumen: A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis of the two-tone response envelope of the device under test (DUT). A main difference with similar methods is its inherent simplicity, avoiding a preprocessing stage and resorting to simpler circuitry to process the envelope. As a consequence, the main nonlinearity specifications of the DUT can be easily estimated from the envelope signal without the need of expensive RF test equipment.
Cita: Barragán Asián, M.J., Fiorelli, R., Vázquez García de la Vega, D., Rueda Rueda, A. y Huertas Díaz, J.L. (2010). On-chip characterization of RF systems based on envelope response analysis. Electronics Letters, 46 (1), 36-38.
Tamaño: 76.43Kb
Formato: PDF

URI: https://hdl.handle.net/11441/71354

DOI: 10.1049/el.2010.2644

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