dc.creator | White, Jules | es |
dc.creator | Schmidt, Douglas C. | es |
dc.creator | Benavides Cuevas, David Felipe | es |
dc.creator | Trinidad Martín Arroyo, Pablo | es |
dc.creator | Ruiz Cortés, Antonio | es |
dc.date.accessioned | 2017-10-06T08:53:49Z | |
dc.date.available | 2017-10-06T08:53:49Z | |
dc.date.issued | 2008 | |
dc.identifier.citation | White, J., Schmidt, D.C., Benavides Cuevas, D.F., Trinidad Martín Arroyo, P. y Ruiz Cortés, A. (2008). Automated Diagnosis of Product-line Configuration Errors in Feature Models. En SPLC 2008: 12th International Software Product Line Conference (225-234), Limerick, Ireland: IEEE Computer Society. | |
dc.identifier.isbn | 978-0-7695-3303-2 | es |
dc.identifier.uri | http://hdl.handle.net/11441/65058 | |
dc.description.abstract | Feature models are widely used to model software
product-line (SPL) variability. SPL variants are configured
by selecting feature sets that satisfy feature model constraints.
Configuration of large feature models can involve
multiple stages and participants, which makes it hard to
avoid conflicts and errors. New techniques are therefore
needed to debug invalid configurations and derive the minimal
set of changes to fix flawed configurations.
This paper provides three contributions to debugging
feature model configurations: (1) we present a technique
for transforming a flawed feature model configuration into
a Constraint Satisfaction Problem (CSP) and show how a
constraint solver can derive the minimal set of feature selection
changes to fix an invalid configuration, (2) we show
how this diagnosis CSP can automatically resolve conflicts
between configuration participant decisions, and (3)
we present experiment results that evaluate our technique.
These results show that our technique scales to models with
over 5,000 features, which is well beyond the size used to
validate other automated techniques. | es |
dc.description.sponsorship | Comisión Interministerial de Ciencia y Tecnología TIN2006-00472 | es |
dc.format | application/pdf | es |
dc.language.iso | eng | es |
dc.publisher | IEEE Computer Society | es |
dc.relation.ispartof | SPLC 2008: 12th International Software Product Line Conference (2008), p 225-234 | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.title | Automated Diagnosis of Product-line Configuration Errors in Feature Models | es |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/submittedVersion | es |
dc.rights.accessrights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Lenguajes y Sistemas Informáticos | es |
dc.relation.projectID | TIN2006-00472 | es |
dc.relation.publisherversion | http://ieeexplore.ieee.org/document/4626856/ | es |
dc.identifier.doi | 10.1109/SPLC.2008.16 | es |
dc.contributor.group | Universidad de Sevilla. TIC205: Ingeniería del Software Aplicada | es |
idus.format.extent | 10 | es |
dc.publication.initialPage | 225 | es |
dc.publication.endPage | 234 | es |
dc.eventtitle | SPLC 2008: 12th International Software Product Line Conference | es |
dc.eventinstitution | Limerick, Ireland | es |
dc.relation.publicationplace | New York, USA | es |
dc.contributor.funder | Comisión Interministerial de Ciencia y Tecnología (CICYT). España | |