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dc.creatorWhite, Juleses
dc.creatorSchmidt, Douglas C.es
dc.creatorBenavides Cuevas, David Felipees
dc.creatorTrinidad Martín Arroyo, Pabloes
dc.creatorRuiz Cortés, Antonioes
dc.date.accessioned2017-10-06T08:53:49Z
dc.date.available2017-10-06T08:53:49Z
dc.date.issued2008
dc.identifier.citationWhite, J., Schmidt, D.C., Benavides Cuevas, D.F., Trinidad Martín Arroyo, P. y Ruiz Cortés, A. (2008). Automated Diagnosis of Product-line Configuration Errors in Feature Models. En SPLC 2008: 12th International Software Product Line Conference (225-234), Limerick, Ireland: IEEE Computer Society.
dc.identifier.isbn978-0-7695-3303-2es
dc.identifier.urihttp://hdl.handle.net/11441/65058
dc.description.abstractFeature models are widely used to model software product-line (SPL) variability. SPL variants are configured by selecting feature sets that satisfy feature model constraints. Configuration of large feature models can involve multiple stages and participants, which makes it hard to avoid conflicts and errors. New techniques are therefore needed to debug invalid configurations and derive the minimal set of changes to fix flawed configurations. This paper provides three contributions to debugging feature model configurations: (1) we present a technique for transforming a flawed feature model configuration into a Constraint Satisfaction Problem (CSP) and show how a constraint solver can derive the minimal set of feature selection changes to fix an invalid configuration, (2) we show how this diagnosis CSP can automatically resolve conflicts between configuration participant decisions, and (3) we present experiment results that evaluate our technique. These results show that our technique scales to models with over 5,000 features, which is well beyond the size used to validate other automated techniques.es
dc.description.sponsorshipComisión Interministerial de Ciencia y Tecnología TIN2006-00472es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherIEEE Computer Societyes
dc.relation.ispartofSPLC 2008: 12th International Software Product Line Conference (2008), p 225-234
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleAutomated Diagnosis of Product-line Configuration Errors in Feature Modelses
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/submittedVersiones
dc.rights.accessrightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Lenguajes y Sistemas Informáticoses
dc.relation.projectIDTIN2006-00472es
dc.relation.publisherversionhttp://ieeexplore.ieee.org/document/4626856/es
dc.identifier.doi10.1109/SPLC.2008.16es
dc.contributor.groupUniversidad de Sevilla. TIC205: Ingeniería del Software Aplicadaes
idus.format.extent10es
dc.publication.initialPage225es
dc.publication.endPage234es
dc.eventtitleSPLC 2008: 12th International Software Product Line Conferencees
dc.eventinstitutionLimerick, Irelandes
dc.relation.publicationplaceNew York, USAes
dc.contributor.funderComisión Interministerial de Ciencia y Tecnología (CICYT). España

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