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Automated Diagnosis of Product-line Configuration Errors in Feature Models

 

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Opened Access Automated Diagnosis of Product-line Configuration Errors in Feature Models
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Author: White, Jules
Schmidt, Douglas C.
Benavides Cuevas, David Felipe
Trinidad Martín Arroyo, Pablo
Ruiz Cortés, Antonio
Department: Universidad de Sevilla. Departamento de Lenguajes y Sistemas Informáticos
Date: 2008
Published in: SPLC 2008: 12th International Software Product Line Conference (2008), p 225-234
ISBN/ISSN: 978-0-7695-3303-2
Document type: Presentation
Abstract: Feature models are widely used to model software product-line (SPL) variability. SPL variants are configured by selecting feature sets that satisfy feature model constraints. Configuration of large feature models can involve multiple stages and ...
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Cite: White, J., Schmidt, D.C., Benavides Cuevas, D.F., Trinidad Martín Arroyo, P. y Ruiz Cortés, A. (2008). Automated Diagnosis of Product-line Configuration Errors in Feature Models. En SPLC 2008: 12th International Software Product Line Conference (225-234), Limerick, Ireland: IEEE Computer Society.
Size: 598.5Kb
Format: PDF

URI: http://hdl.handle.net/11441/65058

DOI: 10.1109/SPLC.2008.16

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