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dc.creatorSegura Rueda, Sergioes
dc.creatorHierons, Robert M.es
dc.creatorBenavides Cuevas, David Felipees
dc.creatorRuiz Cortés, Antonioes
dc.date.accessioned2017-05-29T09:14:29Z
dc.date.available2017-05-29T09:14:29Z
dc.date.issued2010
dc.identifier.citationSegura Rueda, S., Hierons, R.M., Benavides Cuevas, D.F. y Ruiz Cortés, A. (2010). Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach. En ICST 2010: Third International Conference on Software Testing, Verification and Validation (35-44), Paris, Francia: IEEE Computer Society.
dc.identifier.isbn978-1-4244-6435-7es
dc.identifier.urihttp://hdl.handle.net/11441/60614
dc.description.abstractA Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic involving a number of analysis operations, algorithms, paradigms and tools. Implementing these operations is far from trivial and easily leads to errors and defects in analysis solutions. Current testing methods in this context mainly rely on the ability of the tester to decide whether the output of an analysis is correct. However, this is acknowledged to be time-consuming, error-prone and in most cases infeasible due to the combinatorial complexity of the analyses. In this paper, we present a set of relations (so-called metamorphic relations) between input FMs and their set of products and a test data generator relying on them. Given an FM and its known set of products, a set of neighbour FMs together with their corresponding set of products are automatically generated and used for testing different analyses. Complex FMs representing millions of products can be efficiently created applying this process iteratively. The evaluation of our approach using mutation testing as well as real faults and tools reveals that most faults can be automatically detected within a few secondses
dc.description.sponsorshipCICYT TIN2009- 07366es
dc.description.sponsorshipJunta de Andalucía TIC-2533es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherIEEE Computer Societyes
dc.relation.ispartofICST 2010: Third International Conference on Software Testing, Verification and Validation (2010), p 35-44
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleAutomated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approaches
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/submittedVersiones
dc.rights.accessrightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Lenguajes y Sistemas Informáticoses
dc.relation.projectIDTIN2009- 07366es
dc.relation.projectIDTIC-2533es
dc.relation.publisherversionhttp://ieeexplore.ieee.org/document/5477103/es
dc.identifier.doi10.1109/ICST.2010.20es
dc.contributor.groupUniversidad de Sevilla. TIC205: Ingeniería del Software Aplicadaes
idus.format.extent10es
dc.publication.initialPage35es
dc.publication.endPage44es
dc.eventtitleICST 2010: Third International Conference on Software Testing, Verification and Validationes
dc.eventinstitutionParis, Franciaes
dc.relation.publicationplaceUSAes
dc.contributor.funderComisión Interministerial de Ciencia y Tecnología (CICYT). España
dc.contributor.funderJunta de Andalucía

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