dc.creator | Ruiz de Clavijo Vázquez, Paulino | es |
dc.creator | Juan Chico, Jorge | es |
dc.creator | Bellido Díaz, Manuel Jesús | es |
dc.creator | Acosta Jiménez, Antonio José | es |
dc.creator | Valencia Barrero, Manuel | es |
dc.date.accessioned | 2017-01-19T10:42:52Z | |
dc.date.available | 2017-01-19T10:42:52Z | |
dc.date.issued | 2001 | |
dc.identifier.citation | Ruiz de Clavijo Vázquez, P., Juan Chico, J., Bellido Díaz, M.J., Acosta Jiménez, A.J. y Valencia Barrero, M. (2001). HALOTIS: high accuracy LOgic TIming simulator with inertial and degradation delay model. En Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001 (467-471), Munich, Germany: IEEE Computer Society. | |
dc.identifier.isbn | 0-7695-0993-2 | es |
dc.identifier.issn | 1530-1591 | es |
dc.identifier.uri | http://hdl.handle.net/11441/52463 | |
dc.description.abstract | This communication presents HALOTIS, a novel high
accuracy logic timing simulation tool, that incorporates a
new simulation algorithm based on different concepts for
transitions and events. This new simulation algorithm is
intended for including the inertial and degradation delay
models. Simulation results are very similar to those
obtained by electrical simulators, and show a higher
accuracy compared to conventional delay models
implemented in current logic simulators. | es |
dc.description.sponsorship | Ministerio de Ciencia y Tecnología TIC 2000-1350 | es |
dc.format | application/pdf | es |
dc.language.iso | eng | es |
dc.publisher | IEEE Computer Society | es |
dc.relation.ispartof | Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001 (2001), p 467-471 | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.title | HALOTIS: high accuracy LOgic TIming simulator with inertial and degradation delay model | es |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/submittedVersion | es |
dc.rights.accessrights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Tecnología Electrónica | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo | es |
dc.relation.projectID | TIC 2000-1350 | es |
dc.relation.publisherversion | http://ieeexplore.ieee.org/document/915065/ | es |
dc.identifier.doi | 10.1109/DATE.2001.915065 | es |
idus.format.extent | 5 | es |
dc.publication.initialPage | 467 | es |
dc.publication.endPage | 471 | es |
dc.eventtitle | Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001 | es |
dc.eventinstitution | Munich, Germany | es |
dc.relation.publicationplace | USA | es |
dc.contributor.funder | Ministerio de Ciencia y Tecnología (MCYT). España | |