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IGBT-gating failure effect on a fault-tolerant predictive current-controlled five-phase induction motor drive

 

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Opened Access IGBT-gating failure effect on a fault-tolerant predictive current-controlled five-phase induction motor drive
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Author: Guzmán, Hugo
Barrero, Federico
Durán, Mario J.
Department: Universidad de Sevilla. Departamento de Ingeniería Electrónica
Date: 2015
Published in: IEEE Transactions on Industrial Electronics, 62 (1), 15-20
Document type: Article
Abstract: Multiphase machine drives are gaining importance in high-reliability applications due to their fault-tolerance capability and their ability to cope with the postfault operation without any extra electronic components. Predictive current controllers have been recently proposed for managing postfault operation of these drives when an open-phase fault is considered. However, the faulty situation assumes zero stator current while freewheeling diodes can continue conducting in a noncontrolled mode. This work analyzes the postfault operation of the five-phase drive when the freewheeling diodes of the faulty phase are still conducting. Experimental results are provided using a conventional insulated-gate bipolar transistor (IGBT)-based multiphase power converter to quantify the effect of the freewheeling diodes, when an IGBT-gating fault occurs, on the model-based predictive current-controlled drive.
Size: 975.4Kb
Format: PDF

URI: http://hdl.handle.net/11441/34896

DOI: http://dx.doi.org/10.1109/TIE.2014.2331019

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