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dc.creatorBenavides Cuevas, David Felipe
dc.creatorSegura Rueda, Sergio
dc.creatorTrinidad Martín Arroyo, Pablo
dc.creatorRuiz Cortés, Antonio
dc.date.accessioned2015-06-29T14:55:31Z
dc.date.available2015-06-29T14:55:31Z
dc.date.issued2006
dc.identifier.citationBenavides Cuevas, D.F., Segura Rueda, S., Trinidad Martín Arroyo, P. y Ruiz Cortés, A. (2006). A First Step Towards a Framework for the Automated Analysis of Feature Models.
dc.identifier.otherhttp://www.lsi.us.es/~trinidad/docs/benavides06-splc.pdf
dc.identifier.urihttp://hdl.handle.net/11441/26361
dc.description.abstractFeature modelling is a common mechanism for variability management in the context of software product lines. After years of progress, the number of proposals to automatically analyse feature models is still modest and the data about the performance of the different solvers and logic representations used in such area are practically non–existent. Three of the most promising proposals for the automated analysis of feature models are based on the mapping of feature models into CSP, SAT and BDD solvers. in this paper we present a performance test between three off-the-shelf Java CSP, SAT and BDD solvers to analyse feature models which is a novel contribution. in addition, we conclude that the integration of such proposals in a framework will be a key challenge in the future.
dc.formatapplication/pdf
dc.language.isoeng
dc.relation.ispartofManaging Variability for Software Product Lines: Workging with Variability Mechanism, SPLC'06, 10th, Baltimore, Maryland, USA
dc.rightsAtribución-NoComercial-SinDerivadas 4.0 España
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0
dc.titleA First Step Towards a Framework for the Automated Analysis of Feature Models
dc.typeinfo:eu-repo/semantics/conferenceObject
dcterms.identifierhttps://ror.org/03yxnpp24
dc.rights.accessrightsinfo:eu-repo/semantics/openAccess
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Lenguajes y Sistemas Informáticos
dc.contributor.groupUniversidad de Sevilla. TIC205: Ingeniería del Software Aplicada
dc.identifier.idushttps://idus.us.es/xmlui/handle/11441/26361

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