Barragán Asián, Manuel JoséVázquez García de la Vega, DiegoRueda Rueda, Adoración2018-03-272018-03-272010Barragán Asián, M.J., Vázquez García de la Vega, D. y Rueda Rueda, A. (2010). A BIST solution for frequency domain characterization of analog circuits. Journal of Electronic Testing, 26 (4), 429-441.0923-8174 (impreso)1573-0727 (electrónico)https://hdl.handle.net/11441/71350This work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion and offset measurements. Signal generation is performed using a modified filter, while response evaluation is based on 1storder ÓÄ modulation and very simple digital processing. The signal generator and the response analyzer have been implemented using the Switched-Capacitor (SC) technique in a standard 0.35ìm-3.3V CMOS technology. Both circuits have been separately validated, and an on-board prototype of the complete test system for frequency characterization has been implemented. Experimental results verify the functionality of the proposed approach, and a dynamic range of 70dB@62.5kHz (1MHz clock) has been demonstrated.application/pdfengAttribution-NonCommercial-NoDerivatives 4.0 Internacionalhttp://creativecommons.org/licenses/by-nc-nd/4.0/Analog BISTSignal GeneratorFrequency Response CharacterizationOn-Chip Spectrum AnalyzerOn-Chip Network Analyzerinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/openAccesshttps://doi.org/10.1007/s10836-010-5158-7