Barragán Asián, Manuel JoséFiorelli, RafaellaVázquez García de la Vega, DiegoRueda Rueda, AdoraciónHuertas Díaz, José Luis2018-03-272018-03-272010Barragán Asián, M.J., Fiorelli, R., Vázquez García de la Vega, D., Rueda Rueda, A. y Huertas Díaz, J.L. (2010). On-chip characterization of RF systems based on envelope response analysis. Electronics Letters, 46 (1), 36-38.0013-5194 (impreso)1350-911X (electrónico)https://hdl.handle.net/11441/71354A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis of the two-tone response envelope of the device under test (DUT). A main difference with similar methods is its inherent simplicity, avoiding a preprocessing stage and resorting to simpler circuitry to process the envelope. As a consequence, the main nonlinearity specifications of the DUT can be easily estimated from the envelope signal without the need of expensive RF test equipment.application/pdfengAttribution-NonCommercial-NoDerivatives 4.0 Internacionalhttp://creativecommons.org/licenses/by-nc-nd/4.0/info:eu-repo/semantics/articleinfo:eu-repo/semantics/openAccesshttps://doi.org/10.1049/el.2010.2644