García-Tenorio García-Balmaseda, RafaelMorilla García, YolandaGarcía Alía, Rubén2025-07-172025-07-172025-04-25Martín Holgado, P. (2025). Combined Irradiation Study on Electronic Devices with Potential Use in Space and Other Harsh Environments at the 'Centro Nacional de Aceleradores'. (Tesis Doctoral Inédita). Universidad de Sevilla, Sevilla.https://hdl.handle.net/11441/175400The present doctoral dissertation, "Combined Irradiation Study on Electronic Devices with Potential Use in Space and Other Harsh Environments at the Centro Nacional de Aceleradores performed mainly at that center, with three research stays at CERN, explores the development, enhancement, and consolidation of the CNA Irradiation Unit. This research aims to advance the capabilities of irradiation testing for electronic devices, focusing on gamma radiation and low-energy protons, with the novel integration of temperature-controlled environments. These advances are critical to ensure the reliability of electronic systems designed for space missions and other demanding applications. The study begins with a comprehensive characterization of space and terrestrial radiation environments, identifying the challenges presented by total ionizing dose (TID), displacement damage (DD), and single-event effects (SEE) on electronic devices. These phenomena are thoroughly analyzed with respect to their physical mechanisms and impact on device performance, particularly in space missions and high-energy physics accelerators. The research employs the CNA’s three irradiation facilities, the gamma radiation laboratory (RadLab), the 3-MV Tandem, and Cyclone 18 / 9 cyclotron accelerators, to establish a robust experimental framework for irradiation testing. A major contribution of this work is the implementation of the PHOENIX chamber, an innovative system that enables combined radiation and temperature tests. This capability allows for the evaluation of synergistic effects, such as the interaction between radiation and extreme temperatures, which are crucial in understanding device performance under real-world operational conditions. Key experimental campaigns detailed in this thesis include: - Characterization of the gamma radiation field at CNA, emphasizing dosimetric precision, reproducibility, and inter-laboratory comparisons. - Radiation effects on cutting-edge components, such as HfO2-based memristors, optocouplers, and field-programmable gate arrays (FPGAs). - Study of synergistic effects between TID, SEU, and temperature in SRAMs to assess the possible influences on the soft error cross-section, as well as the impact of temperature on TID degradation of GaN transistors. The findings of this research underscore the importance of understanding complex radiation-induced phenomena and developing standardized testing protocols to ensure the resilience of electronic systems. The results not only reinforce CNA’s role as a leading European facility in radiation testing, but also contribute significantly to the fields of radiation hardness assurance and electronic component design for extreme environments. Future directions proposed in this thesis include expanding irradiation capabilities to encompass a wider range of particle energies and fluxes, further refinement of synergistic effect studies, and enhanced collaborations with international research organizations. These advances aim to address the evolving challenges in radiation effects research and to support the development of next-generation technologies for space and other harsh environments.application/pdf310 p.spaAttribution-NonCommercial 4.0 Internationalhttp://creativecommons.org/licenses/by-nc/4.0/info:eu-repo/semantics/doctoralThesisinfo:eu-repo/semantics/openAccess