2023-02-132023-02-132020Diaz Fortuny, J., Saraza Canflanca, P., Castro Lopez, R., Roca, E., Martin Martinez, J., Rodriguez, R.,...,Nafria, M. (2020). Flexible Setup for the Measurement of CMOS Time-Dependent Variability with Array-Based Integrated Circuits. IEEE Transactions on Instrumentation and Measurement, 69 (3), 853-864. https://doi.org/10.1109/TIM.2019.2906415.0018-94561557-9662https://hdl.handle.net/11441/142679This paper presents an innovative and automated measurement setup for the characterization of variability effects in CMOS transistors using array-based integrated circuits (ICs), through which a better understanding of CMOS reliability could be attained. This setup addresses the issues that come with the need for a trustworthy statistical characterization of these effects: testing a very large number of devices accurately but, also, in a timely manner. The setup consists of software and hardware components that provide a user-friendly interface to perform the statistical characterization of CMOS transistors. Five different electrical tests, comprehending time-zero and time-dependent variability effects, can be carried out. Test preparation is, with the described setup, reduced to a few seconds. Moreover, smart parallelization techniques allow reducing the typically time-consuming aging characterization from months to days or even hours. The scope of this paper thus encompasses the methodology and practice of measurement of CMOS time-dependent variability, as well as the development of appropriate measurement systems and components used in efficiently generating and acquiring the necessary electrical signals.application/pdf10 p.engAttribution-NonCommercial-NoDerivatives 4.0 Internacionalhttp://creativecommons.org/licenses/by-nc-nd/4.0/AgingAutomated characterization labBias temperature instability (BTI)Device modelingHot carrier injection (HCI)Random telegraph noise (RTN)Variabilityinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/openAccess10.1109/TIM.2019.2906415