Castro, CeliaAndreozzi, A.Benassayag, G.Beltrán, Ana M.Seguini, G.Perego, M.Schamm-Chardon, Sylvie2018-01-222018-01-222012Castro, C., Andreozzi, A., Benassayag, G., Beltrán, A.M., Seguini, G., Perego, M. y Schamm-Chardon, S. (2012). EFTEM studies on the localization of silicon nanocrystals embedded in SiO2 for nano-devices. En 15th European Microscopy Conference Manchester (Gran Bretaña): The Royal Microscopical Society.https://hdl.handle.net/11441/69292We investigated for the first time the capabilities of combining Si NCs fabrication methods like e-beam evaporation and ULE-IBS with block copolymers nanostructured masks.application/pdfengAttribution-NonCommercial-NoDerivatives 4.0 Internacionalhttp://creativecommons.org/licenses/by-nc-nd/4.0/EFTEMNon-volatile memoriesSelf-assembled block-copolymere-beam evaporationULE-IBSinfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/openAccess