Ovejero Benito, M. C.Pérez Vega-Leal, AlfredoGallardo Fuentes, María IsabelEspino Navas, José ManuelSelva, A.Cortés Giraldo, Miguel AntonioArráns, Rafael2020-04-132020-04-132017Ovejero Benito, M.C., Perez Vega-Leal, A., Gallardo Fuentes, M.I., Espino Navas, J.M., Selva, A., Cortés Giraldo, M.A. y Arráns, R. (2017). LabVIEW-based control and acquisition system for the dosimetric characterization of a silicon strip detector. Review of Scientific Instruments, 88, 025104.0034-6748 (impreso)1089-7623 (electrónico)https://hdl.handle.net/11441/95041Theaimofthisworkistopresentanewdataacquisition,control,andanalysissoftwaresystemwrittenin LabVIEW.Thissystemhasbeendesignedtoobtainthedosimetryofasiliconstripdetectorinpolyethylene. It allows the full automation of the experiments and data analysis required for the dosimetric characterization of silicon detectors. It becomes a useful tool that can be applied in the daily routine check of a beam accelerator.application/pdf8 p.engAttribution-NonCommercial-NoDerivatives 4.0 Internacionalhttp://creativecommons.org/licenses/by-nc-nd/4.0/info:eu-repo/semantics/articleinfo:eu-repo/semantics/openAccesshttps://doi.org/10.1063/1.4974817