Molina Abril, HelenaDíaz del Río, FernandoGuerrero Lebrero, María de la PazReal Jurado, PedroBarcena, GuillermoBraza, VerónicaGuerrero Vázquez, ElisaGonzález, DavidGalindo Riaño, Pedro Luis2020-02-262020-02-262019Molina Abril, H., Díaz del Río, F., Guerrero Lebrero, M.P., Real Jurado, P., Barcena, G., Braza, V.,...,Galindo Riaño, P.L. (2019). Topological Homogeneity for Electron Microscopy Images. En CTIC 2019 : 7th International Workshop on Computational Topology in Image Contex (166-178), Málaga, España: Springer.978-3-030-10827-40302-9743https://hdl.handle.net/11441/93662In this paper, the concept of homogeneity is defined, from a topological perspective, in order to analyze how uniform is the material composition in 2D electron microscopy images. Topological multiresolution parameters are taken into account to obtain better results than classical techniques.application/pdfengAttribution-NonCommercial-NoDerivatives 4.0 Internacionalhttp://creativecommons.org/licenses/by-nc-nd/4.0/TopologyHomogeneityElectron microscopyImagesinfo:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/openAccesshttps://doi.org/10.1007/978-3-030-10828-1_13