Santagiustina, Francesco B.L.Agnesi, CostantinoAlarcón Cuevas, ÁlvaroCabello Quintero, AdánXavier, Guilherme B.Villoresi, PaoloVallone, Giuseppe2024-05-152024-05-152024-04-202334-2536https://hdl.handle.net/11441/158353Time-bin (TB) and energy-time (ET) entanglements are crucial resources for long-distance quantum information processing. However, their standard implementations suffer from the so-called post-selection loophole that allows for classical simulation and thus prevents quantum advantage. The post-selection loophole has been addressed in proof-of-principle experiments. An open problem though is to close it in real-life applications based on integrated technologies. This is especially important since, so far, all integrated sources of TB and ET entanglements suffer from the post-selection loophole. Here, we report post-selection loophole-free certification of TB or ET entanglement in integrated technologies, by implementing in a silicon nitride chip the “hug” scheme [Phys. Rev. Lett. 102, 040401 (2009) [CrossRef] ] and certifying genuine TB entanglement through the violation of a Bell inequality.application/pdf14 p.engAtribución 4.0 Internacionalhttp://creativecommons.org/licenses/by/4.0/Time-binEnergy-timeIntegrated photonicsinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/openAccesshttps://doi.org/10.1364/OPTICA.499247