dc.creator | Segura Rueda, Sergio | es |
dc.creator | Hierons, Robert M. | es |
dc.creator | Benavides Cuevas, David Felipe | es |
dc.creator | Ruiz Cortés, Antonio | es |
dc.date.accessioned | 2017-05-29T09:14:29Z | |
dc.date.available | 2017-05-29T09:14:29Z | |
dc.date.issued | 2010 | |
dc.identifier.citation | Segura Rueda, S., Hierons, R.M., Benavides Cuevas, D.F. y Ruiz Cortés, A. (2010). Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach. En ICST 2010: Third International Conference on Software Testing, Verification and Validation (35-44), Paris, Francia: IEEE Computer Society. | |
dc.identifier.isbn | 978-1-4244-6435-7 | es |
dc.identifier.uri | http://hdl.handle.net/11441/60614 | |
dc.description.abstract | A Feature Model (FM) is a compact representation of
all the products of a software product line. The automated
extraction of information from FMs is a thriving research
topic involving a number of analysis operations, algorithms,
paradigms and tools. Implementing these operations is far
from trivial and easily leads to errors and defects in analysis
solutions. Current testing methods in this context mainly rely
on the ability of the tester to decide whether the output of
an analysis is correct. However, this is acknowledged to be
time-consuming, error-prone and in most cases infeasible
due to the combinatorial complexity of the analyses.
In this paper, we present a set of relations (so-called
metamorphic relations) between input FMs and their set
of products and a test data generator relying on them.
Given an FM and its known set of products, a set of
neighbour FMs together with their corresponding set of
products are automatically generated and used for testing
different analyses. Complex FMs representing millions of
products can be efficiently created applying this process
iteratively. The evaluation of our approach using mutation
testing as well as real faults and tools reveals that most
faults can be automatically detected within a few seconds | es |
dc.description.sponsorship | CICYT TIN2009- 07366 | es |
dc.description.sponsorship | Junta de Andalucía TIC-2533 | es |
dc.format | application/pdf | es |
dc.language.iso | eng | es |
dc.publisher | IEEE Computer Society | es |
dc.relation.ispartof | ICST 2010: Third International Conference on Software Testing, Verification and Validation (2010), p 35-44 | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.title | Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach | es |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/submittedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Lenguajes y Sistemas Informáticos | es |
dc.relation.projectID | TIN2009- 07366 | es |
dc.relation.projectID | TIC-2533 | es |
dc.relation.publisherversion | http://ieeexplore.ieee.org/document/5477103/ | es |
dc.identifier.doi | 10.1109/ICST.2010.20 | es |
dc.contributor.group | Universidad de Sevilla. TIC205: Ingeniería del Software Aplicada | es |
idus.format.extent | 10 | es |
dc.publication.initialPage | 35 | es |
dc.publication.endPage | 44 | es |
dc.eventtitle | ICST 2010: Third International Conference on Software Testing, Verification and Validation | es |
dc.eventinstitution | Paris, Francia | es |
dc.relation.publicationplace | USA | es |
dc.contributor.funder | Comisión Interministerial de Ciencia y Tecnología (CICYT). España | |
dc.contributor.funder | Junta de Andalucía | |