dc.creator | Diaz Fortuny, Javier | es |
dc.creator | Saraza Canflanca, Pablo | es |
dc.creator | Castro Lopez, Rafael | es |
dc.creator | Roca, Elisenda | es |
dc.creator | Martin Martinez, Javier | es |
dc.creator | Rodriguez, Rosana | es |
dc.creator | Fernández Fernández, Francisco Vidal | es |
dc.creator | Nafria, Montserrat | es |
dc.date.accessioned | 2023-02-13T18:23:20Z | |
dc.date.available | 2023-02-13T18:23:20Z | |
dc.date.issued | 2020 | |
dc.identifier.citation | Diaz Fortuny, J., Saraza Canflanca, P., Castro Lopez, R., Roca, E., Martin Martinez, J., Rodriguez, R.,...,Nafria, M. (2020). Flexible Setup for the Measurement of CMOS Time-Dependent Variability with Array-Based Integrated Circuits. IEEE Transactions on Instrumentation and Measurement, 69 (3), 853-864. https://doi.org/10.1109/TIM.2019.2906415. | |
dc.identifier.issn | 0018-9456 | es |
dc.identifier.issn | 1557-9662 | es |
dc.identifier.uri | https://hdl.handle.net/11441/142679 | |
dc.description.abstract | This paper presents an innovative and automated measurement setup for the characterization of variability effects in CMOS transistors using array-based integrated circuits (ICs), through which a better understanding of CMOS reliability could be attained. This setup addresses the issues that come with the need for a trustworthy statistical characterization of these effects: testing a very large number of devices accurately but, also, in a timely manner. The setup consists of software and hardware components that provide a user-friendly interface to perform the statistical characterization of CMOS transistors. Five different electrical tests, comprehending time-zero and time-dependent variability effects, can be carried out. Test preparation is, with the described setup, reduced to a few seconds. Moreover, smart parallelization techniques allow reducing the typically time-consuming aging characterization from months to days or even hours. The scope of this paper thus encompasses the methodology and practice of measurement of CMOS time-dependent variability, as well as the development of appropriate measurement systems and components used in efficiently generating and acquiring the necessary electrical signals. | es |
dc.description.sponsorship | Ministerio de Ciencia, Innovación y Universidades TEC2016-75151-C3-R | es |
dc.format | application/pdf | es |
dc.format.extent | 10 p. | es |
dc.language.iso | eng | es |
dc.publisher | IEEE | es |
dc.relation.ispartof | IEEE Transactions on Instrumentation and Measurement, 69 (3), 853-864. | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | Aging | es |
dc.subject | Automated characterization lab | es |
dc.subject | Bias temperature instability (BTI) | es |
dc.subject | Device modeling | es |
dc.subject | Hot carrier injection (HCI) | es |
dc.subject | Random telegraph noise (RTN) | es |
dc.subject | Variability | es |
dc.title | Flexible Setup for the Measurement of CMOS Time-Dependent Variability with Array-Based Integrated Circuits | es |
dc.type | info:eu-repo/semantics/article | es |
dc.type.version | info:eu-repo/semantics/acceptedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo | es |
dc.relation.projectID | TEC2016-75151-C3-R | es |
dc.relation.publisherversion | https://dx.doi.org/10.1109/TIM.2019.2906415 | es |
dc.identifier.doi | 10.1109/TIM.2019.2906415 | es |
dc.journaltitle | IEEE Transactions on Instrumentation and Measurement | es |
dc.publication.volumen | 69 | es |
dc.publication.issue | 3 | es |
dc.publication.initialPage | 853 | es |
dc.publication.endPage | 864 | es |
dc.contributor.funder | Ministerio de Ciencia, Innovación y Universidades (MICINN). España | es |