Browsing Artículos (Instituto de Microelectrónica de Sevilla (IMSE-CNM)) by Subject "Defects"
Now showing items 1-2 of 2
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Article
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
(Elsevier, 2021-11)In nowadays deeply scaled CMOS technologies, time-zero and time-dependent variability effects have become important concerns ...
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Article
Unified RTN and BTI statistical compact modeling from a defect-centric perspective
(Elsevier, 2021-11)In nowadays deeply scaled CMOS technologies, time-dependent variability effects have become important concerns for analog ...