Browsing Ponencias (Física Aplicada I) by Subject 

Browsing Ponencias (Física Aplicada I) by Subject "ion beam analysis"

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      Comprehensive environmental testing of optical properties in thin films 

      Heras, Irene; Guillén Guillén, Elena; Krause, Matthias; Wenisch, Robert; Escobar-Galindo, Ramón; Endrino, José Luis (ScienceDirect, 2014)
      Environmental characterization of optical and structural properties of thin films continues to be a challenging task. To ...