Browsing Artículos (Electrónica y Electromagnetismo) by Subject "Characterization"
Now showing items 1-3 of 3
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Article
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level
(Elsevier B.V., 2020-05)In the past few years, Time-Dependent Variability has become a subject of growing concern in CMOS technologies. In particular, ...
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Article
Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs
(IEEE, 2022)The origin of some Time-Dependent Variability phenomena in FET technologies has been attributed to the charge carrier ...
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Article
Unified RTN and BTI statistical compact modeling from a defect-centric perspective
(Elsevier, 2021-11)In nowadays deeply scaled CMOS technologies, time-dependent variability effects have become important concerns for analog ...