ListarArtículos (Electrónica y Electromagnetismo) por materia "positive BTI (PBTI)"
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Artículo
A versatile CMOS transistor array IC for the statistical characterization of time-zero variability, RTN, BTI, and HCI
(Institute of Electrical and Electronics Engineers (IEEE), 2019)Statistical characterization of CMOS transistor variability phenomena in modern nanometer technologies is key for accurate ...