Now showing items 1-8 of 8

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      Characterization and Validation of a‑Si Magnetron-Sputtered Thin Films as Solid He Targets with High Stability for Nuclear Reactions  [Article]

      Fortio Godinho, Vanda Cristina; Ferrer Fernández, Francisco Javier; Fernández Martínez, Begoña; Caballero Hernández, Jaime; Gómez Camacho, Joaquín José; Fernández Camacho, Asunción (American Chemical Society, 2016)
      In this work, we present our magnetron sputtering based methodology to produce amorphous silicon coatings with closed porosity, as a strategy to fabricate solid helium targets, in the form of supported or self-supported ...
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      Microscopic and macroscopic dielectric description of mixed oxide thin films  [Article]

      Ferrer Fernández, Francisco Javier; Yubero Valencia, Francisco; Mejías Romero, José Antonio; García López, Francisco Javier; Rodríguez González-Elipe, Agustín (American Institute of Physics, 2007)
      Compact Si–Ti–O and Si–Zr–O mixed oxide thin films are studied by optical characterization refractive index, band gap energy and local probes Auger parameter obtained by x-ray photoelectron spectroscopy . Interpretation ...
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      Nanostructured Ti thin films by magnetron sputtering at oblique angles  [Article]

      Álvarez, Rafael; García Martín, José Miguel; García-Valenzuela, Aurelio; Macías Montero, Manuel Jesús; Ferrer Fernández, Francisco Javier; Santiso, José; Cotrino Bautista, José; Rico Gavira, Víctor Joaquín; Rodríguez González-Elipe, Agustín; Palmero Acebedo, Alberto (Institute of Physics Publishing, 2016)
      The growth of Ti thin films by the magnetron sputtering technique at oblique angles and at room temperature is analysed from both experimental and theoretical points of view. Unlike other materials deposited in similar ...
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      Plasma Assisted Oblique Angle Deposition of Transparent and Conductive in- Plane Anisotropic ITO Thin Films  [Article]

      Parra Barranco, Julián; Sánchez Valencia, Juan Ramón; García García, Francisco Javier; López Santos, Carmen; Gónzales Elipe, Agustín R; Aparicio Rebollo, Francisco Javier; Rico Gavira, Víctor Joaquín; Barranco Quero, Ángel; Ferrer Fernández, Francisco Javier; Borrás Martos, Ana Isabel (Electrochemical Society, 2017)
      Oblique angle deposition (OAD) is a powerful technique for the fabrication of porous nanostructured oxide thin films. OAD films typically present a columnar tilted nanostructure due to geometrical shadowing effects during ...
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      Plasma Assisted Oblique Angle Deposition of Transparent and Conductive in-Plane Anisotropic ITO Thin Films  [Article]

      Parra Barranco, Julián; Sánchez Valencia, Juan Ramón; Aparicio Rebollo, Francisco Javier; Ferrer Fernández, Francisco Javier; García García, Francisco; Rico Gavira, Víctor Joaquín; López Santos, Carmen; Borrás Martos, Ana Isabel; Rodríguez González-Elipe, Agustín; Barranco Quero, Ángel (Electrochemical Society, 2017)
      Oblique angle deposition (OAD) is a powerful technique for the fabrication of porous nanostructured oxide thin films. OAD films typically present a columnar tilted nanostructure due to geometrical shadowing effects during ...
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      Preparation and characterization of 33-S samples for 33-S(n,alpha)30-Si cross-section measurements at the n_TOF facility at CERN  [Article]

      Praena Rodríguez, Javier; Ferrer Fernández, Francisco Javier; Vollenberg, Wil; Sabaté Gilarte, Marta; Fernández Martínez, Begoña; García López, Francisco Javier; Porras, I.; Quesada Molina, José Manuel; Altstadt, Sebastian G.; Andrzejewski, J.; Audouin, Laurent; Cortés Giraldo, Miguel Antonio; Lerendegui Marco, Jorge (Elsevier, 2018-02-15)
      Thin 33S samples for the study of the 33S(n,a)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of 33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, ...
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      Simultaneous quantification of light elements in thin films deposited on Si substrates using proton EBS (Elastic Backscattering Spectroscopy)  [Article]

      Ferrer Fernández, Francisco Javier; Alcaire Martín, María; Caballero Hernández, Jaime; García García, Francisco Javier; Gil Rostra, Jorge; Terriza Fernández, Antonia; Fortio Godinho, Vanda Cristina; García López, Francisco Javier; Barranco Quero, Ángel; Fernández Camacho, Asunción (Elsevier, 2014)
      Quantification of light elements content in thin films is an important and difficult issue in many technological fields such as polymeric functional thin films, organic thin film devices, biomaterials, and doped semiconducting ...
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      Size and shape of supported zirconia nanoparticles determined by x-ray photoelectron spectroscopy  [Article]

      Yubero Valencia, Francisco; Mansilla Sánchez, Catalina; Ferrer Fernández, Francisco Javier; Holgado Vázquez, Juan Pedro; Rodríguez González-Elipe, Agustín (American Institute of Physics, 2007)
      The initial stages of growth of zirconia nanoparticles deposited on SiO2, Y2O3, and CeO2 substrates have been studied by the x-ray photoelectron spectroscopy peak shape analysis. ZrO2 was deposited by plasma decomposition ...