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dc.creatorMillán Calderón, Alejandro
dc.creatorJuan Chico, Jorge
dc.creatorBellido Díaz, Manuel Jesús
dc.creatorRuiz de Clavijo Vázquez, Paulino
dc.creatorGuerrero Martos, David
dc.date.accessioned2015-11-25T06:49:35Z
dc.date.available2015-11-25T06:49:35Z
dc.date.issued2002-08-27
dc.identifier.citationMillán Calderón, A., Juan Chico, J., Bellido Díaz, M.J., Ruiz de Clavijo Vázquez, P. y Guerrero Martos, D. (2002). Characterization of Normal Propagation Delay for Delay Degradation Model (DDM). Lecture Notes in Computer Science, 2451, 477-486.
dc.identifier.issn0302-9743es
dc.identifier.urihttp://hdl.handle.net/11441/31000
dc.description12th International Workshop, PATMOS: : International Workshop on Power and Timing Modeling, Optimization and Simulation, Seville, Spain, September 11–13, 2002 ISBN: 978-3-540-44143-4
dc.description.abstractIn previous papers we have presented a very accurate model that handles the generation and propagation of glitches, which makes an important headway in logic timing simulation. This model is called Delay Degradation Model (DDM). Characterizing DDM completely also implies the characterization of the normal propagation delay. In this paper, we propose a simple heuristic model that includes its dependence on the output load and the input transition time. We have tested this model and found a mean deviation lower than 4%. Also, we present a characterization process for this model that is fully integrated into AUTODDM without affecting the total simulation time needed to characterize a standard cell.es
dc.description.sponsorshipMinisterio de Ciencia y Tecnología MODEL TIC 2000-1350es
dc.description.sponsorshipMinisterio de Ciencia y Tecnología VERDI TIC 2002-2283es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherSpringeres
dc.relation.ispartofLecture Notes in Computer Science, 2451, 477-486.
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectdigital circuites
dc.subjectCMOSes
dc.subjectpropagation delayes
dc.subjectglitches
dc.subjectDelay Degradation Model (DDM)es
dc.titleCharacterization of Normal Propagation Delay for Delay Degradation Model (DDM)es
dc.typeinfo:eu-repo/semantics/articlees
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Tecnología Electrónicaes
dc.relation.projectIDMODEL TIC 2000-1350es
dc.relation.projectIDVERDI TIC 2002-2283es
dc.relation.publisherversionhttps://doi.org/10.1007/3-540-45716-X_48es
dc.identifier.doi10.1007/3-540-45716-X_48es
dc.journaltitleLecture Notes in Computer Sciencees
dc.publication.volumen2451es
dc.publication.initialPage477es
dc.publication.endPage486es
dc.identifier.idushttps://idus.us.es/xmlui/handle/11441/31000
dc.contributor.funderMinisterio de Ciencia y Tecnología (MCYT). España

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