Artículo
Depth-selective 2D-ACAR studies on low-k dielectric thin films
Autor/es | Eijt, S.W.H.
Veen, A. van Falub, Claudiu V. Escobar-Galindo, Ramón Schut, Henk Mijnarends, P.E. Theije, Fremke de Balkenende, A.R. |
Departamento | Universidad de Sevilla. Departamento de Física Aplicada I |
Fecha de publicación | 2003 |
Fecha de depósito | 2023-07-04 |
Publicado en |
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Resumen | Depth-selective 2D-ACAR investigations on ordered mesoporous silica thin films provide direct evidence that para-positronium (p-Ps) created deep in the films can escape through a network of interconnected pores. The depth ... Depth-selective 2D-ACAR investigations on ordered mesoporous silica thin films provide direct evidence that para-positronium (p-Ps) created deep in the films can escape through a network of interconnected pores. The depth dependence of the escape fraction and of the average kinetic energy of non-thermally excited p-Ps is in quantitative agreement with Monte Carlo modeling, assuming classical collisions of p-Ps with the pore walls. The model provides insight in the shape of the angular correlation distributions and their sensitivity to, e.g., the effective wall mass Ms and pore dimensions. |
Cita | Eijt, S.W.H., Veen, A.v., Falub, C.V., Escobar-Galindo, R., Schut, H., Mijnarends, P.E.,...,Balkenende, .R. (2003). Depth-selective 2D-ACAR studies on low-k dielectric thin films. Radiation Physics and Chemistry, 68 (3-4), 357-362. https://doi.org/10.1016/S0969-806X(03)00184-1. |
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